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Statistical Pattern Recognition

Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions.  It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining,...

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Detalles Bibliográficos
Autores principales: Webb, Andrew R, Copsey, Keith D
Lenguaje:eng
Publicado: John Wiley & Sons 2011
Materias:
Acceso en línea:http://cds.cern.ch/record/1486347
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author Webb, Andrew R
Copsey, Keith D
author_facet Webb, Andrew R
Copsey, Keith D
author_sort Webb, Andrew R
collection CERN
description Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions.  It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields,
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institution Organización Europea para la Investigación Nuclear
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publisher John Wiley & Sons
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spelling cern-14863472021-04-22T00:17:56Zhttp://cds.cern.ch/record/1486347engWebb, Andrew RCopsey, Keith DStatistical Pattern RecognitionMathematical Physics and Mathematics Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions.  It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields,John Wiley & Sonsoai:cds.cern.ch:14863472011
spellingShingle Mathematical Physics and Mathematics
Webb, Andrew R
Copsey, Keith D
Statistical Pattern Recognition
title Statistical Pattern Recognition
title_full Statistical Pattern Recognition
title_fullStr Statistical Pattern Recognition
title_full_unstemmed Statistical Pattern Recognition
title_short Statistical Pattern Recognition
title_sort statistical pattern recognition
topic Mathematical Physics and Mathematics
url http://cds.cern.ch/record/1486347
work_keys_str_mv AT webbandrewr statisticalpatternrecognition
AT copseykeithd statisticalpatternrecognition