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Statistical Pattern Recognition
Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining,...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
John Wiley & Sons
2011
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1486347 |
_version_ | 1780926130075729920 |
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author | Webb, Andrew R Copsey, Keith D |
author_facet | Webb, Andrew R Copsey, Keith D |
author_sort | Webb, Andrew R |
collection | CERN |
description | Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields, |
id | cern-1486347 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2011 |
publisher | John Wiley & Sons |
record_format | invenio |
spelling | cern-14863472021-04-22T00:17:56Zhttp://cds.cern.ch/record/1486347engWebb, Andrew RCopsey, Keith DStatistical Pattern RecognitionMathematical Physics and Mathematics Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields,John Wiley & Sonsoai:cds.cern.ch:14863472011 |
spellingShingle | Mathematical Physics and Mathematics Webb, Andrew R Copsey, Keith D Statistical Pattern Recognition |
title | Statistical Pattern Recognition |
title_full | Statistical Pattern Recognition |
title_fullStr | Statistical Pattern Recognition |
title_full_unstemmed | Statistical Pattern Recognition |
title_short | Statistical Pattern Recognition |
title_sort | statistical pattern recognition |
topic | Mathematical Physics and Mathematics |
url | http://cds.cern.ch/record/1486347 |
work_keys_str_mv | AT webbandrewr statisticalpatternrecognition AT copseykeithd statisticalpatternrecognition |