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Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade

The Insertable B-layer (IBL) is a fourth pixel layer that will be added inside the existing ATLAS pixel detector during the long LHC shutdown of 2013 and 2014. The new four layer pixel system will ensure excellent tracking, vertexing and b-tagging performance in the high luminosity pile-up condition...

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Autor principal: Backhaus, M.
Lenguaje:eng
Publicado: 2012
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/8/03/C03013
http://cds.cern.ch/record/1491213
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author Backhaus, M.
author_facet Backhaus, M.
author_sort Backhaus, M.
collection CERN
description The Insertable B-layer (IBL) is a fourth pixel layer that will be added inside the existing ATLAS pixel detector during the long LHC shutdown of 2013 and 2014. The new four layer pixel system will ensure excellent tracking, vertexing and b-tagging performance in the high luminosity pile-up conditions projected for the next LHC run. The peak luminosity is expected to reach 3 x 10^34 cm^-2 s^-1 with an integrated luminosity over the IBL lifetime of 300 fb^-1 corresponding to a design lifetime fluence of 5 x 10^15 n_eq cm^-2 and ionizing dose of 250 Mrad including safety factors. The production front-end electronics FE-I4B for the IBL has been fabricated at the end of 2011 and has been extensively characterized on diced ICs as well as at the wafer level. The production tests at the wafer level were performed during 2012. Selected results of the diced IC characterization are presented, including measurements of the on-chip voltage regulators. The IBL powering scheme, which was chosen based on these results, is described. Preliminary wafer to wafer distributions as well as yield calculations are given.
id cern-1491213
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2012
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spelling cern-14912132023-03-14T19:26:30Zdoi:10.1088/1748-0221/8/03/C03013http://cds.cern.ch/record/1491213engBackhaus, M.Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgradeDetectors and Experimental TechniquesThe Insertable B-layer (IBL) is a fourth pixel layer that will be added inside the existing ATLAS pixel detector during the long LHC shutdown of 2013 and 2014. The new four layer pixel system will ensure excellent tracking, vertexing and b-tagging performance in the high luminosity pile-up conditions projected for the next LHC run. The peak luminosity is expected to reach 3 x 10^34 cm^-2 s^-1 with an integrated luminosity over the IBL lifetime of 300 fb^-1 corresponding to a design lifetime fluence of 5 x 10^15 n_eq cm^-2 and ionizing dose of 250 Mrad including safety factors. The production front-end electronics FE-I4B for the IBL has been fabricated at the end of 2011 and has been extensively characterized on diced ICs as well as at the wafer level. The production tests at the wafer level were performed during 2012. Selected results of the diced IC characterization are presented, including measurements of the on-chip voltage regulators. The IBL powering scheme, which was chosen based on these results, is described. Preliminary wafer to wafer distributions as well as yield calculations are given.The Insertable B-layer (IBL) is a fourth pixel layer that will be added inside the existing ATLAS pixel detector during the long LHC shutdown of 2013 and 2014. The new four layer pixel system will ensure excellent tracking, vertexing and b-tagging performance in the high luminosity pile-up conditions projected for the next LHC run. The peak luminosity is expected to reach 3·10(34) cm(−)(2)s(−)(1)with an integrated luminosity over the IBL lifetime of 300 fb(−)(1) corresponding to a design lifetime fluence of 5·10(15) neqcm(−)(2) and ionizing dose of 250 Mrad including safety factors. The production front-end electronics FE-I4B for the IBL has been fabricated at the end of 2011 and has been extensively characterized on diced ICs as well as at the wafer level. The production tests at the wafer level were performed during 2012. Selected results of the diced IC characterization are presented, including measurements of the on-chip voltage regulators. The IBL powering scheme, which was chosen based on these results, is described. Preliminary wafer to wafer distributions as well as yield calculations are given.arXiv:1304.4424ATL-INDET-PROC-2012-019oai:cds.cern.ch:14912132012-11-01
spellingShingle Detectors and Experimental Techniques
Backhaus, M.
Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade
title Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade
title_full Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade
title_fullStr Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade
title_full_unstemmed Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade
title_short Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade
title_sort characterization of the fe-i4b pixel readout chip production run for the atlas insertable b-layer upgrade
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/8/03/C03013
http://cds.cern.ch/record/1491213
work_keys_str_mv AT backhausm characterizationofthefei4bpixelreadoutchipproductionrunfortheatlasinsertableblayerupgrade