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Quality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL Production

To improve performance of the ATLAS inner tracker, a fourth Pixel layer, called the Insertable B-layer (IBL), will be installed in 2014 on a new beam pipe. A new read out chip generation, FE-I4, has been developed and two different sensor designs, a rather conventional planar and a 3D design, have b...

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Autor principal: Jentzsch, J
Lenguaje:eng
Publicado: 2012
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/8/02/C02048
http://cds.cern.ch/record/1493044
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author Jentzsch, J
author_facet Jentzsch, J
author_sort Jentzsch, J
collection CERN
description To improve performance of the ATLAS inner tracker, a fourth Pixel layer, called the Insertable B-layer (IBL), will be installed in 2014 on a new beam pipe. A new read out chip generation, FE-I4, has been developed and two different sensor designs, a rather conventional planar and a 3D design, have been flip chipped to these front ends. New staves holding new stave and module flex circuits have been developed as well. Therefore, a production QA test bench has been established to test all production staves before integration with the new beam pipe. This setup combines former ATLAS Pixel services and a new readout system, namely the RCE (Reconfigurable Cluster Element) system developed at SLAC. With this setup all production staves will be tested to ensure the installation of only those staves which fulfill the IBL criteria. Quality assurance measurements under cleanroom conditions, including temperature and humidity control, are performed on the individual components during the various production steps of the IBL, namely connectivity as well as electrical tests and signal probing on individual parts and assembled subsystems. The pre-assembly QC procedures, the capabilities of the stave qualification setup, and recent results from testing a prototype stave are presented and discussed. The corresponding poster was presented on TWEPP (Topical Workshop on Electronics for Particle Physics) 2012 in Oxford, UK.
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spelling cern-14930442019-09-30T06:29:59Zdoi:10.1088/1748-0221/8/02/C02048http://cds.cern.ch/record/1493044engJentzsch, JQuality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL ProductionDetectors and Experimental TechniquesTo improve performance of the ATLAS inner tracker, a fourth Pixel layer, called the Insertable B-layer (IBL), will be installed in 2014 on a new beam pipe. A new read out chip generation, FE-I4, has been developed and two different sensor designs, a rather conventional planar and a 3D design, have been flip chipped to these front ends. New staves holding new stave and module flex circuits have been developed as well. Therefore, a production QA test bench has been established to test all production staves before integration with the new beam pipe. This setup combines former ATLAS Pixel services and a new readout system, namely the RCE (Reconfigurable Cluster Element) system developed at SLAC. With this setup all production staves will be tested to ensure the installation of only those staves which fulfill the IBL criteria. Quality assurance measurements under cleanroom conditions, including temperature and humidity control, are performed on the individual components during the various production steps of the IBL, namely connectivity as well as electrical tests and signal probing on individual parts and assembled subsystems. The pre-assembly QC procedures, the capabilities of the stave qualification setup, and recent results from testing a prototype stave are presented and discussed. The corresponding poster was presented on TWEPP (Topical Workshop on Electronics for Particle Physics) 2012 in Oxford, UK.ATL-INDET-PROC-2012-024oai:cds.cern.ch:14930442012-11-09
spellingShingle Detectors and Experimental Techniques
Jentzsch, J
Quality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL Production
title Quality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL Production
title_full Quality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL Production
title_fullStr Quality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL Production
title_full_unstemmed Quality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL Production
title_short Quality Assurance and Functionality Tests on Electrical Components during the ATLAS IBL Production
title_sort quality assurance and functionality tests on electrical components during the atlas ibl production
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/8/02/C02048
http://cds.cern.ch/record/1493044
work_keys_str_mv AT jentzschj qualityassuranceandfunctionalitytestsonelectricalcomponentsduringtheatlasiblproduction