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The impact of microelectronics on particle detection
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
1984
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/0168-9002(84)90158-X http://cds.cern.ch/record/149571 |
| _version_ | 1780880360142274560 |
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| author | Heijne, Erik H M Jarron, Pierre |
| author_facet | Heijne, Erik H M Jarron, Pierre |
| author_sort | Heijne, Erik H M |
| collection | CERN |
| id | cern-149571 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1984 |
| record_format | invenio |
| spelling | cern-1495712019-09-30T06:29:59Zdoi:10.1016/0168-9002(84)90158-Xhttp://cds.cern.ch/record/149571engHeijne, Erik H MJarron, PierreThe impact of microelectronics on particle detectionDetectors and Experimental TechniquesCERN-EF-84-001CERN-EF-84-01CERN-EF-84-1oai:cds.cern.ch:1495711984-01-16 |
| spellingShingle | Detectors and Experimental Techniques Heijne, Erik H M Jarron, Pierre The impact of microelectronics on particle detection |
| title | The impact of microelectronics on particle detection |
| title_full | The impact of microelectronics on particle detection |
| title_fullStr | The impact of microelectronics on particle detection |
| title_full_unstemmed | The impact of microelectronics on particle detection |
| title_short | The impact of microelectronics on particle detection |
| title_sort | impact of microelectronics on particle detection |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/0168-9002(84)90158-X http://cds.cern.ch/record/149571 |
| work_keys_str_mv | AT heijneerikhm theimpactofmicroelectronicsonparticledetection AT jarronpierre theimpactofmicroelectronicsonparticledetection AT heijneerikhm impactofmicroelectronicsonparticledetection AT jarronpierre impactofmicroelectronicsonparticledetection |