The impact of microelectronics on particle detection

Detalles Bibliográficos
Autores principales: Heijne, Erik H M, Jarron, Pierre
Lenguaje:eng
Publicado: 1984
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/0168-9002(84)90158-X
http://cds.cern.ch/record/149571

Internet

https://dx.doi.org/10.1016/0168-9002(84)90158-X
http://cds.cern.ch/record/149571

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