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The impact of microelectronics on particle detection

Detalles Bibliográficos
Autores principales:	Heijne, Erik H M, Jarron, Pierre
Lenguaje:	eng
Publicado:	1984
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1016/0168-9002(84)90158-X http://cds.cern.ch/record/149571

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