Soft Error Recovery during Operation of the CMS Experiment

In high energy physics experiments such as the Compact Muon Solenoid (CMS), the electronics located near the interaction region are prone to soft errors as a result of radiation coming from the collisions. Depending on the type of error, the scope of their impact on data collection can range from being hardly noticeable to being completely debilitating. In this presentation, we present evidence of soft errors in CMS, and describe a mechanism used by CMS which allows subsystems to recover from soft errors in an automated way. Results will be shown as to the effectiveness of this scheme to maximize the uptime of CMS.