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Robust SRAM Designs and Analysis
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular...
Autores principales: | Singh, Jawar, Mohanty, Saraju P, Pradhan, Dhiraj K |
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Lenguaje: | eng |
Publicado: |
Springer
2013
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-1-4614-0818-5 http://cds.cern.ch/record/1500172 |
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