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Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost,...
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| Lenguaje: | eng |
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Springer
2013
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| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4614-1749-1 http://cds.cern.ch/record/1500183 |