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Design, Analysis and Test of Logic Circuits Under Uncertainty
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. To improve future semiconductor designs,...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2013
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-90-481-9644-9 http://cds.cern.ch/record/1500412 |