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Test and Diagnosis for Small-Delay Defects
This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable meth...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2012
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4419-8297-1 http://cds.cern.ch/record/1503620 |