Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...

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Detalles Bibliográficos
Autores principales: Bou-Sleiman, Sleiman, Ismail, Mohammed
Lenguaje:eng
Publicado: Springer 2012
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1007/978-1-4419-9548-3
http://cds.cern.ch/record/1503627
Descripción
Sumario:This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 

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