Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...

Descripción completa

Detalles Bibliográficos
Autores principales: Bou-Sleiman, Sleiman, Ismail, Mohammed
Lenguaje:eng
Publicado: Springer 2012
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1007/978-1-4419-9548-3
http://cds.cern.ch/record/1503627
_version_ 1780927145044869120
author Bou-Sleiman, Sleiman
Ismail, Mohammed
author_facet Bou-Sleiman, Sleiman
Ismail, Mohammed
author_sort Bou-Sleiman, Sleiman
collection CERN
description This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 
id cern-1503627
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2012
publisher Springer
record_format invenio
spelling cern-15036272021-04-21T23:54:41Zdoi:10.1007/978-1-4419-9548-3http://cds.cern.ch/record/1503627engBou-Sleiman, SleimanIsmail, MohammedBuilt-in-Self-Test and Digital Self-Calibration for RF SoCsEngineeringThis book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. Springeroai:cds.cern.ch:15036272012
spellingShingle Engineering
Bou-Sleiman, Sleiman
Ismail, Mohammed
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
title Built-in-Self-Test and Digital Self-Calibration for RF SoCs
title_full Built-in-Self-Test and Digital Self-Calibration for RF SoCs
title_fullStr Built-in-Self-Test and Digital Self-Calibration for RF SoCs
title_full_unstemmed Built-in-Self-Test and Digital Self-Calibration for RF SoCs
title_short Built-in-Self-Test and Digital Self-Calibration for RF SoCs
title_sort built-in-self-test and digital self-calibration for rf socs
topic Engineering
url https://dx.doi.org/10.1007/978-1-4419-9548-3
http://cds.cern.ch/record/1503627
work_keys_str_mv AT bousleimansleiman builtinselftestanddigitalselfcalibrationforrfsocs
AT ismailmohammed builtinselftestanddigitalselfcalibrationforrfsocs

Ejemplares similares