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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...
| Autores principales: | , |
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| Lenguaje: | eng |
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Springer
2012
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| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4419-9548-3 http://cds.cern.ch/record/1503627 |