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High Quality Test Pattern Generation and Boolean Satisfiability
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...
| Autores principales: | , |
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| Lenguaje: | eng |
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Springer
2012
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| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4419-9976-4 http://cds.cern.ch/record/1503634 |