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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult tas...

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Detalles Bibliográficos
Autores principales: Laurila, Tomi, Vuorinen, Vesa, Paulasto-Kröckel, Mervi, Turunen, Markus, Mattila, Toni T, Kivilahti, Jorma
Lenguaje:eng
Publicado: Springer 2012
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-1-4471-2470-2
http://cds.cern.ch/record/1503663

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