Cargando…
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-m...
| Autores principales: | , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
2012
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-20329-9 http://cds.cern.ch/record/1503809 |