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Neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap Calorimeter

The expected increase of total integrated luminosity by a factor ten at the HL-LHC compared to the design goals for LHC essentially eliminates the safety factor for radiation hardness realized at the current cold amplifiers of the ATLAS Hadronic End-cap Calorimeter (HEC). New more radiation hard tec...

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Autor principal: Nagel, Martin
Lenguaje:eng
Publicado: 2013
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1742-6596/404/1/012062
http://cds.cern.ch/record/1506336
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author Nagel, Martin
author_facet Nagel, Martin
author_sort Nagel, Martin
collection CERN
description The expected increase of total integrated luminosity by a factor ten at the HL-LHC compared to the design goals for LHC essentially eliminates the safety factor for radiation hardness realized at the current cold amplifiers of the ATLAS Hadronic End-cap Calorimeter (HEC). New more radiation hard technologies have been studied: SiGe bipolar, Si CMOS FET and GaAs FET transistors have been irradiated with neutrons up to an integrated fluence of 2.2 x 10^{16} n/cm^2 and with 200 MeV protons up to an integrated fluence of 2.6 x 10^{14} p/cm^2. Comparisons of transistor parameters such as the gain for both types of irradiations are presented.
id cern-1506336
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2013
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spelling cern-15063362023-03-29T12:28:10Zdoi:10.1088/1742-6596/404/1/012062http://cds.cern.ch/record/1506336engNagel, MartinNeutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap CalorimeterDetectors and Experimental TechniquesThe expected increase of total integrated luminosity by a factor ten at the HL-LHC compared to the design goals for LHC essentially eliminates the safety factor for radiation hardness realized at the current cold amplifiers of the ATLAS Hadronic End-cap Calorimeter (HEC). New more radiation hard technologies have been studied: SiGe bipolar, Si CMOS FET and GaAs FET transistors have been irradiated with neutrons up to an integrated fluence of 2.2 x 10^{16} n/cm^2 and with 200 MeV protons up to an integrated fluence of 2.6 x 10^{14} p/cm^2. Comparisons of transistor parameters such as the gain for both types of irradiations are presented.arXiv:1301.3750oai:cds.cern.ch:15063362013-01-17
spellingShingle Detectors and Experimental Techniques
Nagel, Martin
Neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap Calorimeter
title Neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap Calorimeter
title_full Neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap Calorimeter
title_fullStr Neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap Calorimeter
title_full_unstemmed Neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap Calorimeter
title_short Neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the ATLAS Hadronic End-cap Calorimeter
title_sort neutron and proton tests of different technologies for the upgrade of the cold readout electronics of the atlas hadronic end-cap calorimeter
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1742-6596/404/1/012062
http://cds.cern.ch/record/1506336
work_keys_str_mv AT nagelmartin neutronandprotontestsofdifferenttechnologiesfortheupgradeofthecoldreadoutelectronicsoftheatlashadronicendcapcalorimeter