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CompTIA security+ SY0-301 exam cram

Detalles Bibliográficos
Autores principales: Barrett, Diane, Hausman, Kalani Kirk, Weiss, Martin
Lenguaje:eng
Publicado: Pearson Education 2012
Materias:
Acceso en línea:http://cds.cern.ch/record/1515364
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author Barrett, Diane
Hausman, Kalani Kirk
Weiss, Martin
author_facet Barrett, Diane
Hausman, Kalani Kirk
Weiss, Martin
author_sort Barrett, Diane
collection CERN
id cern-1515364
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2012
publisher Pearson Education
record_format invenio
spelling cern-15153642021-04-21T23:23:24Zhttp://cds.cern.ch/record/1515364engBarrett, DianeHausman, Kalani KirkWeiss, MartinCompTIA security+ SY0-301 exam cramComputing and ComputersPearson Educationoai:cds.cern.ch:15153642012
spellingShingle Computing and Computers
Barrett, Diane
Hausman, Kalani Kirk
Weiss, Martin
CompTIA security+ SY0-301 exam cram
title CompTIA security+ SY0-301 exam cram
title_full CompTIA security+ SY0-301 exam cram
title_fullStr CompTIA security+ SY0-301 exam cram
title_full_unstemmed CompTIA security+ SY0-301 exam cram
title_short CompTIA security+ SY0-301 exam cram
title_sort comptia security+ sy0-301 exam cram
topic Computing and Computers
url http://cds.cern.ch/record/1515364
work_keys_str_mv AT barrettdiane comptiasecuritysy0301examcram
AT hausmankalanikirk comptiasecuritysy0301examcram
AT weissmartin comptiasecuritysy0301examcram