Professional test-driven development with C#: developing real world applications with TDD

Detalles Bibliográficos
Autores principales: Bender, James, McWherter, Jeff
Lenguaje:eng
Publicado: Wiley Pub 2011
Materias:
Computing and Computers
Acceso en línea:http://cds.cern.ch/record/1519522
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author Bender, James
McWherter, Jeff
author_facet Bender, James
McWherter, Jeff
author_sort Bender, James
collection CERN
id cern-1519522
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2011
publisher Wiley Pub
record_format invenio
spelling cern-15195222021-04-21T23:08:24Zhttp://cds.cern.ch/record/1519522engBender, JamesMcWherter, JeffProfessional test-driven development with C#: developing real world applications with TDD Computing and ComputersWiley Puboai:cds.cern.ch:15195222011
spellingShingle Computing and Computers
Bender, James
McWherter, Jeff
Professional test-driven development with C#: developing real world applications with TDD
title Professional test-driven development with C#: developing real world applications with TDD
title_full Professional test-driven development with C#: developing real world applications with TDD
title_fullStr Professional test-driven development with C#: developing real world applications with TDD
title_full_unstemmed Professional test-driven development with C#: developing real world applications with TDD
title_short Professional test-driven development with C#: developing real world applications with TDD
title_sort professional test-driven development with c#: developing real world applications with tdd
topic Computing and Computers
url http://cds.cern.ch/record/1519522
work_keys_str_mv AT benderjames professionaltestdrivendevelopmentwithcdevelopingrealworldapplicationswithtdd
AT mcwherterjeff professionaltestdrivendevelopmentwithcdevelopingrealworldapplicationswithtdd

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