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Electronic parts reliability data 1997

This document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformer...

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Detalles Bibliográficos
Autores principales: Denson, William, Crowell, William, Jaworski, Paul, Mahar, David
Lenguaje:eng
Publicado: Reliability Information Analysis Center (RIAC) 1996
Materias:
Acceso en línea:http://cds.cern.ch/record/1538527
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author Denson, William
Crowell, William
Jaworski, Paul
Mahar, David
author_facet Denson, William
Crowell, William
Jaworski, Paul
Mahar, David
author_sort Denson, William
collection CERN
description This document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformers, all of which were obtained from the field usage of electronic components. At 2,000 pages, the format of this document is the same as RIAC's popular NPRD document which contains reliability data on nonelectronic component and electronic assembly types. Data includes part descriptions, quality level, application environments, point estimates of failure rate, data sources, number of failures, total operating hours, miles, or cycles, and detailed part characteristics.
id cern-1538527
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1996
publisher Reliability Information Analysis Center (RIAC)
record_format invenio
spelling cern-15385272021-04-21T22:49:19Zhttp://cds.cern.ch/record/1538527engDenson, WilliamCrowell, WilliamJaworski, PaulMahar, DavidElectronic parts reliability data 1997EngineeringThis document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformers, all of which were obtained from the field usage of electronic components. At 2,000 pages, the format of this document is the same as RIAC's popular NPRD document which contains reliability data on nonelectronic component and electronic assembly types. Data includes part descriptions, quality level, application environments, point estimates of failure rate, data sources, number of failures, total operating hours, miles, or cycles, and detailed part characteristics.Reliability Information Analysis Center (RIAC)oai:cds.cern.ch:15385271996
spellingShingle Engineering
Denson, William
Crowell, William
Jaworski, Paul
Mahar, David
Electronic parts reliability data 1997
title Electronic parts reliability data 1997
title_full Electronic parts reliability data 1997
title_fullStr Electronic parts reliability data 1997
title_full_unstemmed Electronic parts reliability data 1997
title_short Electronic parts reliability data 1997
title_sort electronic parts reliability data 1997
topic Engineering
url http://cds.cern.ch/record/1538527
work_keys_str_mv AT densonwilliam electronicpartsreliabilitydata1997
AT crowellwilliam electronicpartsreliabilitydata1997
AT jaworskipaul electronicpartsreliabilitydata1997
AT mahardavid electronicpartsreliabilitydata1997