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Electronic parts reliability data 1997
This document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformer...
Autores principales: | , , , |
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Lenguaje: | eng |
Publicado: |
Reliability Information Analysis Center (RIAC)
1996
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1538527 |
_version_ | 1780929722619789312 |
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author | Denson, William Crowell, William Jaworski, Paul Mahar, David |
author_facet | Denson, William Crowell, William Jaworski, Paul Mahar, David |
author_sort | Denson, William |
collection | CERN |
description | This document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformers, all of which were obtained from the field usage of electronic components. At 2,000 pages, the format of this document is the same as RIAC's popular NPRD document which contains reliability data on nonelectronic component and electronic assembly types. Data includes part descriptions, quality level, application environments, point estimates of failure rate, data sources, number of failures, total operating hours, miles, or cycles, and detailed part characteristics. |
id | cern-1538527 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1996 |
publisher | Reliability Information Analysis Center (RIAC) |
record_format | invenio |
spelling | cern-15385272021-04-21T22:49:19Zhttp://cds.cern.ch/record/1538527engDenson, WilliamCrowell, WilliamJaworski, PaulMahar, DavidElectronic parts reliability data 1997EngineeringThis document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformers, all of which were obtained from the field usage of electronic components. At 2,000 pages, the format of this document is the same as RIAC's popular NPRD document which contains reliability data on nonelectronic component and electronic assembly types. Data includes part descriptions, quality level, application environments, point estimates of failure rate, data sources, number of failures, total operating hours, miles, or cycles, and detailed part characteristics.Reliability Information Analysis Center (RIAC)oai:cds.cern.ch:15385271996 |
spellingShingle | Engineering Denson, William Crowell, William Jaworski, Paul Mahar, David Electronic parts reliability data 1997 |
title | Electronic parts reliability data 1997 |
title_full | Electronic parts reliability data 1997 |
title_fullStr | Electronic parts reliability data 1997 |
title_full_unstemmed | Electronic parts reliability data 1997 |
title_short | Electronic parts reliability data 1997 |
title_sort | electronic parts reliability data 1997 |
topic | Engineering |
url | http://cds.cern.ch/record/1538527 |
work_keys_str_mv | AT densonwilliam electronicpartsreliabilitydata1997 AT crowellwilliam electronicpartsreliabilitydata1997 AT jaworskipaul electronicpartsreliabilitydata1997 AT mahardavid electronicpartsreliabilitydata1997 |