Electronic parts reliability data 1997

This document contains reliability data on both commercial and military electronic components for use in reliability analyses. It contains failure rate data on integrated circuits, discrete semiconductors (diodes, transistors, optoelectronic devices), resistors, capacitors, and inductors/transformer...

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Detalles Bibliográficos
Autores principales: Denson, William, Crowell, William, Jaworski, Paul, Mahar, David
Lenguaje:eng
Publicado: Reliability Information Analysis Center (RIAC) 1996
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/1538527

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