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A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors
The energy loss distribution of charged particles in silicon is approximated by a simple analytical parametrization. Its use is demonstrated through several examples. With the help of energy deposits in sensing elements of the detector, the position of track segments and the corresponding deposited...
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Formato: | info:eu-repo/semantics/article |
Lenguaje: | eng |
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Nucl. Instrum. Methods Phys. Res., A
2012
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1542991 |
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author | Sikler, Ferenc |
author_facet | Sikler, Ferenc |
author_sort | Sikler, Ferenc |
collection | CERN |
description | The energy loss distribution of charged particles in silicon is approximated by a simple analytical parametrization. Its use is demonstrated through several examples. With the help of energy deposits in sensing elements of the detector, the position of track segments and the corresponding deposited energy are estimated with improved accuracy and less bias. The parametrization is successfully used to estimate the energy loss rate of charged particles, and it is applied to detector gain calibration tasks. |
format | info:eu-repo/semantics/article |
id | cern-1542991 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2012 |
publisher | Nucl. Instrum. Methods Phys. Res., A |
record_format | invenio |
spelling | cern-15429912019-09-30T06:29:59Z http://cds.cern.ch/record/1542991 eng Sikler, Ferenc A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors Detectors and Experimental Techniques 2: Common software tools 2.3: Reconstruction toolkit for HEP The energy loss distribution of charged particles in silicon is approximated by a simple analytical parametrization. Its use is demonstrated through several examples. With the help of energy deposits in sensing elements of the detector, the position of track segments and the corresponding deposited energy are estimated with improved accuracy and less bias. The parametrization is successfully used to estimate the energy loss rate of charged particles, and it is applied to detector gain calibration tasks. info:eu-repo/grantAgreement/EC/FP7/262025 info:eu-repo/semantics/openAccess Education Level info:eu-repo/semantics/article http://cds.cern.ch/record/1542991 Nucl. Instrum. Methods Phys. Res., A info:doi/10.1016/j.nima.2012.06.064 Nucl. Instrum. Methods Phys. Res., A, (2012) pp. 16-29 2012 |
spellingShingle | Detectors and Experimental Techniques 2: Common software tools 2.3: Reconstruction toolkit for HEP Sikler, Ferenc A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors |
title | A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors |
title_full | A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors |
title_fullStr | A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors |
title_full_unstemmed | A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors |
title_short | A parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors |
title_sort | parametrisation of the energy loss distributions of charged particles and its applications for silicon detectors |
topic | Detectors and Experimental Techniques 2: Common software tools 2.3: Reconstruction toolkit for HEP |
url | http://cds.cern.ch/record/1542991 http://cds.cern.ch/record/1542991 |
work_keys_str_mv | AT siklerferenc aparametrisationoftheenergylossdistributionsofchargedparticlesanditsapplicationsforsilicondetectors AT siklerferenc parametrisationoftheenergylossdistributionsofchargedparticlesanditsapplicationsforsilicondetectors |