Cargando…
Active inductor shunt peaking in high-speed VCSEL driver design
An all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for...
Autores principales: | , , , , , , , , , |
---|---|
Lenguaje: | eng |
Publicado: |
2013
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1088/1674-1137/37/11/116101 http://cds.cern.ch/record/1553380 |
_version_ | 1780930345041920000 |
---|---|
author | Liang, Futian Gong, Datao Hou, Suen Liu, Chonghan Liu, Tiankuan Su, Da-Shung Teng, Ping-Kun Xiang, Annie Ye, Jingbo Jin, Ge |
author_facet | Liang, Futian Gong, Datao Hou, Suen Liu, Chonghan Liu, Tiankuan Su, Da-Shung Teng, Ping-Kun Xiang, Annie Ye, Jingbo Jin, Ge |
author_sort | Liang, Futian |
collection | CERN |
description | An all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all transistor active inductor shunt peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been tapped out, and the prototype has been proofed by the preliminary electrical test results and bit error ratio test results. The driver achieves 8-Gbps data rate as simulated with the peaking. We present the all transistor active inductor shunt peaking structure, simulation and test results in this paper. |
id | cern-1553380 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2013 |
record_format | invenio |
spelling | cern-15533802023-08-22T03:47:20Zdoi:10.1088/1674-1137/37/11/116101http://cds.cern.ch/record/1553380engLiang, FutianGong, DataoHou, SuenLiu, ChonghanLiu, TiankuanSu, Da-ShungTeng, Ping-KunXiang, AnnieYe, JingboJin, GeActive inductor shunt peaking in high-speed VCSEL driver designDetectors and Experimental TechniquesAn all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all transistor active inductor shunt peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been tapped out, and the prototype has been proofed by the preliminary electrical test results and bit error ratio test results. The driver achieves 8-Gbps data rate as simulated with the peaking. We present the all transistor active inductor shunt peaking structure, simulation and test results in this paper.An all-transistor active-inductor shunt-peaking structure has been used in a prototype of 8 Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25 μm Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all-transistor active-inductor shunt-peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been taped out, and the prototype has been proven by the preliminary electrical test results and bit error ratio test results. The driver achieves 8 Gbps data rate as simulated with the peaking. We present the all-transistor active-inductor shunt-peaking structure, simulation and test results in this paper.An all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all transistor active inductor shunt peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been tapped out, and the prototype has been proofed by the preliminary electrical test results and bit error ratio test results. The driver achieves 8-Gbps data rate as simulated with the peaking. We present the all transistor active inductor shunt peaking structure, simulation and test results in this paper.arXiv:1306.0705oai:cds.cern.ch:15533802013-06-04 |
spellingShingle | Detectors and Experimental Techniques Liang, Futian Gong, Datao Hou, Suen Liu, Chonghan Liu, Tiankuan Su, Da-Shung Teng, Ping-Kun Xiang, Annie Ye, Jingbo Jin, Ge Active inductor shunt peaking in high-speed VCSEL driver design |
title | Active inductor shunt peaking in high-speed VCSEL driver design |
title_full | Active inductor shunt peaking in high-speed VCSEL driver design |
title_fullStr | Active inductor shunt peaking in high-speed VCSEL driver design |
title_full_unstemmed | Active inductor shunt peaking in high-speed VCSEL driver design |
title_short | Active inductor shunt peaking in high-speed VCSEL driver design |
title_sort | active inductor shunt peaking in high-speed vcsel driver design |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1088/1674-1137/37/11/116101 http://cds.cern.ch/record/1553380 |
work_keys_str_mv | AT liangfutian activeinductorshuntpeakinginhighspeedvcseldriverdesign AT gongdatao activeinductorshuntpeakinginhighspeedvcseldriverdesign AT housuen activeinductorshuntpeakinginhighspeedvcseldriverdesign AT liuchonghan activeinductorshuntpeakinginhighspeedvcseldriverdesign AT liutiankuan activeinductorshuntpeakinginhighspeedvcseldriverdesign AT sudashung activeinductorshuntpeakinginhighspeedvcseldriverdesign AT tengpingkun activeinductorshuntpeakinginhighspeedvcseldriverdesign AT xiangannie activeinductorshuntpeakinginhighspeedvcseldriverdesign AT yejingbo activeinductorshuntpeakinginhighspeedvcseldriverdesign AT jinge activeinductorshuntpeakinginhighspeedvcseldriverdesign |