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Active inductor shunt peaking in high-speed VCSEL driver design

An all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for...

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Autores principales: Liang, Futian, Gong, Datao, Hou, Suen, Liu, Chonghan, Liu, Tiankuan, Su, Da-Shung, Teng, Ping-Kun, Xiang, Annie, Ye, Jingbo, Jin, Ge
Lenguaje:eng
Publicado: 2013
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1674-1137/37/11/116101
http://cds.cern.ch/record/1553380
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author Liang, Futian
Gong, Datao
Hou, Suen
Liu, Chonghan
Liu, Tiankuan
Su, Da-Shung
Teng, Ping-Kun
Xiang, Annie
Ye, Jingbo
Jin, Ge
author_facet Liang, Futian
Gong, Datao
Hou, Suen
Liu, Chonghan
Liu, Tiankuan
Su, Da-Shung
Teng, Ping-Kun
Xiang, Annie
Ye, Jingbo
Jin, Ge
author_sort Liang, Futian
collection CERN
description An all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all transistor active inductor shunt peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been tapped out, and the prototype has been proofed by the preliminary electrical test results and bit error ratio test results. The driver achieves 8-Gbps data rate as simulated with the peaking. We present the all transistor active inductor shunt peaking structure, simulation and test results in this paper.
id cern-1553380
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2013
record_format invenio
spelling cern-15533802023-08-22T03:47:20Zdoi:10.1088/1674-1137/37/11/116101http://cds.cern.ch/record/1553380engLiang, FutianGong, DataoHou, SuenLiu, ChonghanLiu, TiankuanSu, Da-ShungTeng, Ping-KunXiang, AnnieYe, JingboJin, GeActive inductor shunt peaking in high-speed VCSEL driver designDetectors and Experimental TechniquesAn all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all transistor active inductor shunt peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been tapped out, and the prototype has been proofed by the preliminary electrical test results and bit error ratio test results. The driver achieves 8-Gbps data rate as simulated with the peaking. We present the all transistor active inductor shunt peaking structure, simulation and test results in this paper.An all-transistor active-inductor shunt-peaking structure has been used in a prototype of 8 Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25 μm Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all-transistor active-inductor shunt-peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been taped out, and the prototype has been proven by the preliminary electrical test results and bit error ratio test results. The driver achieves 8 Gbps data rate as simulated with the peaking. We present the all-transistor active-inductor shunt-peaking structure, simulation and test results in this paper.An all transistor active inductor shunt peaking structure has been used in a prototype of 8-Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25-um Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all transistor active inductor shunt peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been tapped out, and the prototype has been proofed by the preliminary electrical test results and bit error ratio test results. The driver achieves 8-Gbps data rate as simulated with the peaking. We present the all transistor active inductor shunt peaking structure, simulation and test results in this paper.arXiv:1306.0705oai:cds.cern.ch:15533802013-06-04
spellingShingle Detectors and Experimental Techniques
Liang, Futian
Gong, Datao
Hou, Suen
Liu, Chonghan
Liu, Tiankuan
Su, Da-Shung
Teng, Ping-Kun
Xiang, Annie
Ye, Jingbo
Jin, Ge
Active inductor shunt peaking in high-speed VCSEL driver design
title Active inductor shunt peaking in high-speed VCSEL driver design
title_full Active inductor shunt peaking in high-speed VCSEL driver design
title_fullStr Active inductor shunt peaking in high-speed VCSEL driver design
title_full_unstemmed Active inductor shunt peaking in high-speed VCSEL driver design
title_short Active inductor shunt peaking in high-speed VCSEL driver design
title_sort active inductor shunt peaking in high-speed vcsel driver design
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1674-1137/37/11/116101
http://cds.cern.ch/record/1553380
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