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Built-in test for VLSI: pseudorandom techniques
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Wiley
1987
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1555245 |
| _version_ | 1780930422138470400 |
|---|---|
| author | Bardell, Paul H McAnney, William H Savir, Jacob |
| author_facet | Bardell, Paul H McAnney, William H Savir, Jacob |
| author_sort | Bardell, Paul H |
| collection | CERN |
| id | cern-1555245 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1987 |
| publisher | Wiley |
| record_format | invenio |
| spelling | cern-15552452021-04-21T22:37:56Zhttp://cds.cern.ch/record/1555245engBardell, Paul HMcAnney, William HSavir, JacobBuilt-in test for VLSI: pseudorandom techniquesComputing and ComputersWileyoai:cds.cern.ch:15552451987 |
| spellingShingle | Computing and Computers Bardell, Paul H McAnney, William H Savir, Jacob Built-in test for VLSI: pseudorandom techniques |
| title | Built-in test for VLSI: pseudorandom techniques |
| title_full | Built-in test for VLSI: pseudorandom techniques |
| title_fullStr | Built-in test for VLSI: pseudorandom techniques |
| title_full_unstemmed | Built-in test for VLSI: pseudorandom techniques |
| title_short | Built-in test for VLSI: pseudorandom techniques |
| title_sort | built-in test for vlsi: pseudorandom techniques |
| topic | Computing and Computers |
| url | http://cds.cern.ch/record/1555245 |
| work_keys_str_mv | AT bardellpaulh builtintestforvlsipseudorandomtechniques AT mcanneywilliamh builtintestforvlsipseudorandomtechniques AT savirjacob builtintestforvlsipseudorandomtechniques |