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Microelectronics used for Semiconductor Imaging Detectors
Semiconductor crystal technology, microelectronics developments and nuclear particle detection have been in a relation of symbiosis, all the way from the beginning. The increase of complexity in electronics chips can now be applied to obtain much more information on the incident nuclear radiation. S...
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| Lenguaje: | eng |
| Publicado: |
2010
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| Acceso en línea: | https://dx.doi.org/10.1063/1.3295677 http://cds.cern.ch/record/1557338 |
| _version_ | 1780930529759068160 |
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| author | Heijne, Erik H M |
| author_facet | Heijne, Erik H M |
| author_sort | Heijne, Erik H M |
| collection | CERN |
| description | Semiconductor crystal technology, microelectronics developments and nuclear particle detection have been in a relation of symbiosis, all the way from the beginning. The increase of complexity in electronics chips can now be applied to obtain much more information on the incident nuclear radiation. Some basic technologies are described, in order to acquire insight in possibilities and limitations for the most recent detectors. |
| id | cern-1557338 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2010 |
| record_format | invenio |
| spelling | cern-15573382019-09-30T06:29:59Zdoi:10.1063/1.3295677http://cds.cern.ch/record/1557338engHeijne, Erik H MMicroelectronics used for Semiconductor Imaging DetectorsDetectors and Experimental TechniquesSemiconductor crystal technology, microelectronics developments and nuclear particle detection have been in a relation of symbiosis, all the way from the beginning. The increase of complexity in electronics chips can now be applied to obtain much more information on the incident nuclear radiation. Some basic technologies are described, in order to acquire insight in possibilities and limitations for the most recent detectors.oai:cds.cern.ch:15573382010 |
| spellingShingle | Detectors and Experimental Techniques Heijne, Erik H M Microelectronics used for Semiconductor Imaging Detectors |
| title | Microelectronics used for Semiconductor Imaging Detectors |
| title_full | Microelectronics used for Semiconductor Imaging Detectors |
| title_fullStr | Microelectronics used for Semiconductor Imaging Detectors |
| title_full_unstemmed | Microelectronics used for Semiconductor Imaging Detectors |
| title_short | Microelectronics used for Semiconductor Imaging Detectors |
| title_sort | microelectronics used for semiconductor imaging detectors |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1063/1.3295677 http://cds.cern.ch/record/1557338 |
| work_keys_str_mv | AT heijneerikhm microelectronicsusedforsemiconductorimagingdetectors |