Cargando…
Schottky-Enabled Photoemission and Dark Current Measurements-Toward an Alternate Approach to Fowler-Nordheim Plot Analysis
Field-emitted dark current, a major gradient-limiting factor in RF cavities, is usually analyzed via FowlerNordheim (FN) plots. Traditionally, field emission is attributed to geometrical perturbations on the bulk surface whosefield enhancement factor (beta) and the emitting area (A) can be extracted f...
Autores principales: | Wisniewski, E E, Gai, W, Power, J, Du, Y, Hua, J, Yan, L, You, Y, Chen, H, Huang, W, Tang, C, Grudiev, A, Wuensch, W |
---|---|
Lenguaje: | eng |
Publicado: |
2012
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1558350 |
Ejemplares similares
-
Fowler-Nordheim field emission: effects in semiconductor nanostructures
por: Bhattacharya, Sitangshu, et al.
Publicado: (2012) -
An adaptive synaptic array using Fowler–Nordheim dynamic analog memory
por: Mehta, Darshit, et al.
Publicado: (2022) -
On-device synaptic memory consolidation using Fowler-Nordheim quantum-tunneling
por: Rahman, Mustafizur, et al.
Publicado: (2023) -
The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots
por: de Assis, T. A.
Publicado: (2015) -
A self-powered analog sensor-data-logging device based on Fowler-Nordheim dynamical systems
por: Mehta, Darshit, et al.
Publicado: (2020)