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Testing Digital Electronic Protection Systems
This paper outlines the core concepts and realisation of the Safe Machine Parameters Controller (SMPC) testbench, based on a VME crate and LabVIEW program. Its main goal is to ensure the correct function of the SMPC for the protection of the CERN accelerator complex. To achieve this, the tester...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
2011
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Acceso en línea: | http://cds.cern.ch/record/1563823 |
_version_ | 1780930786155823104 |
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author | Gabourin, S Garcia Muñoz, A |
author_facet | Gabourin, S Garcia Muñoz, A |
author_sort | Gabourin, S |
collection | CERN |
description | This paper outlines the core concepts and realisation of the Safe Machine Parameters Controller (SMPC) testbench, based on a VME crate and LabVIEW program. Its main goal is to ensure the correct function of the SMPC for the protection of the CERN accelerator complex. To achieve this, the tester has been built to replicate the machine environment and operation, in order to ensure that the chassis under test is completely exercised. The complexity of the task increases with the number of input combinations. This paper also outlines the benefits and weaknesses of developing a test suite independently of the hardware being tested, using the “V” approach. |
id | cern-1563823 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2011 |
record_format | invenio |
spelling | cern-15638232022-08-17T13:32:37Zhttp://cds.cern.ch/record/1563823engGabourin, SGarcia Muñoz, ATesting Digital Electronic Protection SystemsThis paper outlines the core concepts and realisation of the Safe Machine Parameters Controller (SMPC) testbench, based on a VME crate and LabVIEW program. Its main goal is to ensure the correct function of the SMPC for the protection of the CERN accelerator complex. To achieve this, the tester has been built to replicate the machine environment and operation, in order to ensure that the chassis under test is completely exercised. The complexity of the task increases with the number of input combinations. This paper also outlines the benefits and weaknesses of developing a test suite independently of the hardware being tested, using the “V” approach.oai:cds.cern.ch:15638232011 |
spellingShingle | Gabourin, S Garcia Muñoz, A Testing Digital Electronic Protection Systems |
title | Testing Digital Electronic Protection Systems |
title_full | Testing Digital Electronic Protection Systems |
title_fullStr | Testing Digital Electronic Protection Systems |
title_full_unstemmed | Testing Digital Electronic Protection Systems |
title_short | Testing Digital Electronic Protection Systems |
title_sort | testing digital electronic protection systems |
url | http://cds.cern.ch/record/1563823 |
work_keys_str_mv | AT gabourins testingdigitalelectronicprotectionsystems AT garciamunoza testingdigitalelectronicprotectionsystems |