Characterization of GEM detectors using Garfield++

The Gas Electron Multiplier (GEM) is a type of gaseous ionization detector which is proposed as one of the upgrades in the muon detection region of the CMS experiment at CERN. GEM detectors provide an excellent spatial and time resolution, along with good chemical resistance and radiation hardness. Therefore, for an effective implementation of the upgrade process, it is necessary to characterize the GEM detectors for various properties to have an estimate of their performance while they are being used in the actual detector. This report aims to characterize the GEM detectors using Garfield++, which is one of the simulation softwares used for particle detectors that use gas and semi-conductors as sensitive medium. Using Garfield++, multiple configurations of the GEM detectors were characterized against various design parameters to measure their efficiency as a detection unit.