Firmware Design for a SEU test system

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In this report the firmware design of the new upgraded SEU chip is presented. A single event upset (SEU) is a change of state in memory cells or registers in microelectronic devices caused by ionizing particles. The state change is a result of the free charge created by ionization in a sensitive no...

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Autor principal: Ilyas, Hira
Lenguaje:eng
Publicado: 2013
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/1594977
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author Ilyas, Hira
author_facet Ilyas, Hira
author_sort Ilyas, Hira
collection CERN
description In this report the firmware design of the new upgraded SEU chip is presented. A single event upset (SEU) is a change of state in memory cells or registers in microelectronic devices caused by ionizing particles. The state change is a result of the free charge created by ionization in a sensitive node of the circuit. The code is written and simulate in verilog using ISE version 14.1. If there will be any change in the state of the memory it will be detected through the code.
id cern-1594977
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2013
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spelling cern-15949772019-09-30T06:29:59Zhttp://cds.cern.ch/record/1594977engIlyas, HiraFirmware Design for a SEU test systemEngineeringIn this report the firmware design of the new upgraded SEU chip is presented. A single event upset (SEU) is a change of state in memory cells or registers in microelectronic devices caused by ionizing particles. The state change is a result of the free charge created by ionization in a sensitive node of the circuit. The code is written and simulate in verilog using ISE version 14.1. If there will be any change in the state of the memory it will be detected through the code.CERN-STUDENTS-Note-2013-089oai:cds.cern.ch:15949772013-08-23
spellingShingle Engineering
Ilyas, Hira
Firmware Design for a SEU test system
title Firmware Design for a SEU test system
title_full Firmware Design for a SEU test system
title_fullStr Firmware Design for a SEU test system
title_full_unstemmed Firmware Design for a SEU test system
title_short Firmware Design for a SEU test system
title_sort firmware design for a seu test system
topic Engineering
url http://cds.cern.ch/record/1594977
work_keys_str_mv AT ilyashira firmwaredesignforaseutestsystem

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