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Semiconductor laser engineering, reliability and diagnostics: a practical approach to high power and single mode devices
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap i...
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| Lenguaje: | eng |
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John Wiley & Sons
2013
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| Acceso en línea: | http://cds.cern.ch/record/1602394 |