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Accelerated testing: statistical models, test plans, and data analysis
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to...
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Lenguaje: | eng |
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Wiley
2009
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Acceso en línea: | http://cds.cern.ch/record/1608463 |
_version_ | 1780931798458433536 |
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author | Nelson, Wayne B |
author_facet | Nelson, Wayne B |
author_sort | Nelson, Wayne B |
collection | CERN |
description | The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering.""-Dev G. |
id | cern-1608463 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2009 |
publisher | Wiley |
record_format | invenio |
spelling | cern-16084632021-04-21T22:20:59Zhttp://cds.cern.ch/record/1608463engNelson, Wayne BAccelerated testing: statistical models, test plans, and data analysisEngineeringThe Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering.""-Dev G.Wileyoai:cds.cern.ch:16084632009 |
spellingShingle | Engineering Nelson, Wayne B Accelerated testing: statistical models, test plans, and data analysis |
title | Accelerated testing: statistical models, test plans, and data analysis |
title_full | Accelerated testing: statistical models, test plans, and data analysis |
title_fullStr | Accelerated testing: statistical models, test plans, and data analysis |
title_full_unstemmed | Accelerated testing: statistical models, test plans, and data analysis |
title_short | Accelerated testing: statistical models, test plans, and data analysis |
title_sort | accelerated testing: statistical models, test plans, and data analysis |
topic | Engineering |
url | http://cds.cern.ch/record/1608463 |
work_keys_str_mv | AT nelsonwayneb acceleratedtestingstatisticalmodelstestplansanddataanalysis |