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Accelerated testing: statistical models, test plans, and data analysis

The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to...

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Autor principal: Nelson, Wayne B
Lenguaje:eng
Publicado: Wiley 2009
Materias:
Acceso en línea:http://cds.cern.ch/record/1608463
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author Nelson, Wayne B
author_facet Nelson, Wayne B
author_sort Nelson, Wayne B
collection CERN
description The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering.""-Dev G.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2009
publisher Wiley
record_format invenio
spelling cern-16084632021-04-21T22:20:59Zhttp://cds.cern.ch/record/1608463engNelson, Wayne BAccelerated testing: statistical models, test plans, and data analysisEngineeringThe Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering.""-Dev G.Wileyoai:cds.cern.ch:16084632009
spellingShingle Engineering
Nelson, Wayne B
Accelerated testing: statistical models, test plans, and data analysis
title Accelerated testing: statistical models, test plans, and data analysis
title_full Accelerated testing: statistical models, test plans, and data analysis
title_fullStr Accelerated testing: statistical models, test plans, and data analysis
title_full_unstemmed Accelerated testing: statistical models, test plans, and data analysis
title_short Accelerated testing: statistical models, test plans, and data analysis
title_sort accelerated testing: statistical models, test plans, and data analysis
topic Engineering
url http://cds.cern.ch/record/1608463
work_keys_str_mv AT nelsonwayneb acceleratedtestingstatisticalmodelstestplansanddataanalysis