Cargando…
Soft errors in modern electronic systems
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the v...
Autor principal: | |
---|---|
Lenguaje: | eng |
Publicado: |
Springer
2010
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1612917 |
_version_ | 1780932255158370304 |
---|---|
author | Nicolaidis, Michael |
author_facet | Nicolaidis, Michael |
author_sort | Nicolaidis, Michael |
collection | CERN |
description | This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, s |
id | cern-1612917 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2010 |
publisher | Springer |
record_format | invenio |
spelling | cern-16129172021-04-21T22:11:36Zhttp://cds.cern.ch/record/1612917engNicolaidis, MichaelSoft errors in modern electronic systemsEngineeringThis book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, sSpringeroai:cds.cern.ch:16129172010 |
spellingShingle | Engineering Nicolaidis, Michael Soft errors in modern electronic systems |
title | Soft errors in modern electronic systems |
title_full | Soft errors in modern electronic systems |
title_fullStr | Soft errors in modern electronic systems |
title_full_unstemmed | Soft errors in modern electronic systems |
title_short | Soft errors in modern electronic systems |
title_sort | soft errors in modern electronic systems |
topic | Engineering |
url | http://cds.cern.ch/record/1612917 |
work_keys_str_mv | AT nicolaidismichael softerrorsinmodernelectronicsystems |