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Soft errors in modern electronic systems

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the v...

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Detalles Bibliográficos
Autor principal: Nicolaidis, Michael
Lenguaje:eng
Publicado: Springer 2010
Materias:
Acceso en línea:http://cds.cern.ch/record/1612917
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author Nicolaidis, Michael
author_facet Nicolaidis, Michael
author_sort Nicolaidis, Michael
collection CERN
description This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, s
id cern-1612917
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2010
publisher Springer
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spelling cern-16129172021-04-21T22:11:36Zhttp://cds.cern.ch/record/1612917engNicolaidis, MichaelSoft errors in modern electronic systemsEngineeringThis book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, sSpringeroai:cds.cern.ch:16129172010
spellingShingle Engineering
Nicolaidis, Michael
Soft errors in modern electronic systems
title Soft errors in modern electronic systems
title_full Soft errors in modern electronic systems
title_fullStr Soft errors in modern electronic systems
title_full_unstemmed Soft errors in modern electronic systems
title_short Soft errors in modern electronic systems
title_sort soft errors in modern electronic systems
topic Engineering
url http://cds.cern.ch/record/1612917
work_keys_str_mv AT nicolaidismichael softerrorsinmodernelectronicsystems