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Soft errors in modern electronic systems

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the v...

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Detalles Bibliográficos
Autor principal: Nicolaidis, Michael
Lenguaje:eng
Publicado: Springer 2010
Materias:
Acceso en línea:http://cds.cern.ch/record/1612917

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