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Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing

Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming ""test and try out"" method to obtain the best solution. Modeling and simulation can easily en...

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Detalles Bibliográficos
Autores principales: Liu, Sheng, Liu, Yong
Lenguaje:eng
Publicado: Wiley 2011
Materias:
Acceso en línea:http://cds.cern.ch/record/1613957
Descripción
Sumario:Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming ""test and try out"" method to obtain the best solution. Modeling and simulation can easily ensure virtual Design of Experiments (DoE) to achieve the optimal solution. This has greatly reduced the cost and production time, especially for new product development. Using modeling and simulation will become increasingly necessary for future advances in 3D package development.  In this book, Liu and Liu allow people