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Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing

Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming ""test and try out"" method to obtain the best solution. Modeling and simulation can easily en...

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Detalles Bibliográficos
Autores principales: Liu, Sheng, Liu, Yong
Lenguaje:eng
Publicado: Wiley 2011
Materias:
Acceso en línea:http://cds.cern.ch/record/1613957
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author Liu, Sheng
Liu, Yong
author_facet Liu, Sheng
Liu, Yong
author_sort Liu, Sheng
collection CERN
description Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming ""test and try out"" method to obtain the best solution. Modeling and simulation can easily ensure virtual Design of Experiments (DoE) to achieve the optimal solution. This has greatly reduced the cost and production time, especially for new product development. Using modeling and simulation will become increasingly necessary for future advances in 3D package development.  In this book, Liu and Liu allow people
id cern-1613957
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2011
publisher Wiley
record_format invenio
spelling cern-16139572021-04-21T22:10:49Zhttp://cds.cern.ch/record/1613957engLiu, ShengLiu, YongModeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testingEngineeringAlthough there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming ""test and try out"" method to obtain the best solution. Modeling and simulation can easily ensure virtual Design of Experiments (DoE) to achieve the optimal solution. This has greatly reduced the cost and production time, especially for new product development. Using modeling and simulation will become increasingly necessary for future advances in 3D package development.  In this book, Liu and Liu allow peopleWileyoai:cds.cern.ch:16139572011
spellingShingle Engineering
Liu, Sheng
Liu, Yong
Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing
title Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing
title_full Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing
title_fullStr Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing
title_full_unstemmed Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing
title_short Modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing
title_sort modeling and simulation for microelectronic packaging assembly: manufacturing, reliability and testing
topic Engineering
url http://cds.cern.ch/record/1613957
work_keys_str_mv AT liusheng modelingandsimulationformicroelectronicpackagingassemblymanufacturingreliabilityandtesting
AT liuyong modelingandsimulationformicroelectronicpackagingassemblymanufacturingreliabilityandtesting