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An introduction to logic circuit testing

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level und...

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Detalles Bibliográficos
Autor principal: Lala, Parag K
Lenguaje:eng
Publicado: Morgan & Claypool Publishers 2008
Materias:
Acceso en línea:http://cds.cern.ch/record/1614179
Descripción
Sumario:An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)