An introduction to logic circuit testing

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level und...

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Detalles Bibliográficos
Autor principal: Lala, Parag K
Lenguaje:eng
Publicado: Morgan & Claypool Publishers 2008
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/1614179
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author Lala, Parag K
author_facet Lala, Parag K
author_sort Lala, Parag K
collection CERN
description An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)
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institution Organización Europea para la Investigación Nuclear
language eng
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publisher Morgan & Claypool Publishers
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spelling cern-16141792021-04-21T22:10:25Zhttp://cds.cern.ch/record/1614179engLala, Parag KAn introduction to logic circuit testingEngineeringAn Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)Morgan & Claypool Publishersoai:cds.cern.ch:16141792008
spellingShingle Engineering
Lala, Parag K
An introduction to logic circuit testing
title An introduction to logic circuit testing
title_full An introduction to logic circuit testing
title_fullStr An introduction to logic circuit testing
title_full_unstemmed An introduction to logic circuit testing
title_short An introduction to logic circuit testing
title_sort introduction to logic circuit testing
topic Engineering
url http://cds.cern.ch/record/1614179
work_keys_str_mv AT lalaparagk anintroductiontologiccircuittesting
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