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Sequential analysis: tests and confidence intervals

Detalles Bibliográficos
Autor principal: Siegmund, David
Lenguaje:eng
Publicado: Springer 1985
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-1-4757-1862-1
http://cds.cern.ch/record/1614836
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author Siegmund, David
author_facet Siegmund, David
author_sort Siegmund, David
collection CERN
id cern-1614836
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1985
publisher Springer
record_format invenio
spelling cern-16148362021-04-21T22:08:03Zdoi:10.1007/978-1-4757-1862-1http://cds.cern.ch/record/1614836engSiegmund, DavidSequential analysis: tests and confidence intervalsMathematical Physics and MathematicsSpringeroai:cds.cern.ch:16148361985
spellingShingle Mathematical Physics and Mathematics
Siegmund, David
Sequential analysis: tests and confidence intervals
title Sequential analysis: tests and confidence intervals
title_full Sequential analysis: tests and confidence intervals
title_fullStr Sequential analysis: tests and confidence intervals
title_full_unstemmed Sequential analysis: tests and confidence intervals
title_short Sequential analysis: tests and confidence intervals
title_sort sequential analysis: tests and confidence intervals
topic Mathematical Physics and Mathematics
url https://dx.doi.org/10.1007/978-1-4757-1862-1
http://cds.cern.ch/record/1614836
work_keys_str_mv AT siegmunddavid sequentialanalysistestsandconfidenceintervals