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Measurements using optic and RF waves
Scientific and technical knowledge for measurements in modern electromagnetism must be vast as our electromagnetic environment covers all frequencies and wavelengths. These measurements must be applied to fields as varied as nanotechnologies, telecommunications, meteorology, geolocalization, radioas...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Wiley-ISTE
2013
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1616838 |
| _version_ | 1780932700284125184 |
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| author | De Fornel, Frederique Favennec, Pierre-Noël |
| author_facet | De Fornel, Frederique Favennec, Pierre-Noël |
| author_sort | De Fornel, Frederique |
| collection | CERN |
| description | Scientific and technical knowledge for measurements in modern electromagnetism must be vast as our electromagnetic environment covers all frequencies and wavelengths. These measurements must be applied to fields as varied as nanotechnologies, telecommunications, meteorology, geolocalization, radioastronomy, health, biology, etc. In order to cover the multiple facets of the topic, this book sweeps the entire electromagnetic spectrum, from several hertz to terahertz; considers distances ranging from nanometers to light-years in optics; before extending towards the various measurement techniques |
| id | cern-1616838 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2013 |
| publisher | Wiley-ISTE |
| record_format | invenio |
| spelling | cern-16168382021-04-21T22:03:55Zhttp://cds.cern.ch/record/1616838engDe Fornel, FrederiqueFavennec, Pierre-NoëlMeasurements using optic and RF wavesEngineeringScientific and technical knowledge for measurements in modern electromagnetism must be vast as our electromagnetic environment covers all frequencies and wavelengths. These measurements must be applied to fields as varied as nanotechnologies, telecommunications, meteorology, geolocalization, radioastronomy, health, biology, etc. In order to cover the multiple facets of the topic, this book sweeps the entire electromagnetic spectrum, from several hertz to terahertz; considers distances ranging from nanometers to light-years in optics; before extending towards the various measurement techniques Wiley-ISTEoai:cds.cern.ch:16168382013 |
| spellingShingle | Engineering De Fornel, Frederique Favennec, Pierre-Noël Measurements using optic and RF waves |
| title | Measurements using optic and RF waves |
| title_full | Measurements using optic and RF waves |
| title_fullStr | Measurements using optic and RF waves |
| title_full_unstemmed | Measurements using optic and RF waves |
| title_short | Measurements using optic and RF waves |
| title_sort | measurements using optic and rf waves |
| topic | Engineering |
| url | http://cds.cern.ch/record/1616838 |
| work_keys_str_mv | AT defornelfrederique measurementsusingopticandrfwaves AT favennecpierrenoel measurementsusingopticandrfwaves |