Cargando…
Proceedings of the International Symposium on X-Ray Microscopy
| Autores principales: | , , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
1988
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-540-39246-0 http://cds.cern.ch/record/1623317 |
| _version_ | 1780933379388080128 |
|---|---|
| author | Sayre, David Kirz, Janos Howells, Malcolm Rarback, Harvey |
| author_facet | Sayre, David Kirz, Janos Howells, Malcolm Rarback, Harvey |
| author_sort | Sayre, David |
| collection | CERN |
| id | cern-1623317 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1988 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-16233172021-04-25T16:58:27Zdoi:10.1007/978-3-540-39246-0http://cds.cern.ch/record/1623317engSayre, DavidKirz, JanosHowells, MalcolmRarback, HarveyProceedings of the International Symposium on X-Ray MicroscopyOther Fields of PhysicsSpringeroai:cds.cern.ch:16233171988 |
| spellingShingle | Other Fields of Physics Sayre, David Kirz, Janos Howells, Malcolm Rarback, Harvey Proceedings of the International Symposium on X-Ray Microscopy |
| title | Proceedings of the International Symposium on X-Ray Microscopy |
| title_full | Proceedings of the International Symposium on X-Ray Microscopy |
| title_fullStr | Proceedings of the International Symposium on X-Ray Microscopy |
| title_full_unstemmed | Proceedings of the International Symposium on X-Ray Microscopy |
| title_short | Proceedings of the International Symposium on X-Ray Microscopy |
| title_sort | proceedings of the international symposium on x-ray microscopy |
| topic | Other Fields of Physics |
| url | https://dx.doi.org/10.1007/978-3-540-39246-0 http://cds.cern.ch/record/1623317 |
| work_keys_str_mv | AT sayredavid proceedingsoftheinternationalsymposiumonxraymicroscopy AT kirzjanos proceedingsoftheinternationalsymposiumonxraymicroscopy AT howellsmalcolm proceedingsoftheinternationalsymposiumonxraymicroscopy AT rarbackharvey proceedingsoftheinternationalsymposiumonxraymicroscopy |