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Proceedings of the International Symposium on X-Ray Microscopy

Detalles Bibliográficos
Autores principales:	Sayre, David, Kirz, Janos, Howells, Malcolm, Rarback, Harvey
Lenguaje:	eng
Publicado:	Springer 1988
Materias:	Other Fields of Physics
Acceso en línea:	https://dx.doi.org/10.1007/978-3-540-39246-0 http://cds.cern.ch/record/1623317

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