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Point defects in semiconductors

Detalles Bibliográficos
Autores principales: Lannoo, Michel, Bourgoin, Jacques
Lenguaje:eng
Publicado: Springer 1981
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-81574-4
http://cds.cern.ch/record/1624592
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author Lannoo, Michel
Bourgoin, Jacques
author_facet Lannoo, Michel
Bourgoin, Jacques
author_sort Lannoo, Michel
collection CERN
id cern-1624592
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1981
publisher Springer
record_format invenio
spelling cern-16245922021-04-21T21:45:30Zdoi:10.1007/978-3-642-81574-4http://cds.cern.ch/record/1624592engLannoo, MichelBourgoin, JacquesPoint defects in semiconductorsChemical Physics and ChemistrySpringeroai:cds.cern.ch:16245921981
spellingShingle Chemical Physics and Chemistry
Lannoo, Michel
Bourgoin, Jacques
Point defects in semiconductors
title Point defects in semiconductors
title_full Point defects in semiconductors
title_fullStr Point defects in semiconductors
title_full_unstemmed Point defects in semiconductors
title_short Point defects in semiconductors
title_sort point defects in semiconductors
topic Chemical Physics and Chemistry
url https://dx.doi.org/10.1007/978-3-642-81574-4
http://cds.cern.ch/record/1624592
work_keys_str_mv AT lannoomichel pointdefectsinsemiconductors
AT bourgoinjacques pointdefectsinsemiconductors