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Point defects in semiconductors
Autores principales: | Lannoo, Michel, Bourgoin, Jacques |
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Lenguaje: | eng |
Publicado: |
Springer
1981
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-81574-4 http://cds.cern.ch/record/1624592 |
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