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Point defects in semiconductors
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Springer
1983
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-81832-5 http://cds.cern.ch/record/1624603 |
_version_ | 1780933509606539264 |
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author | Bourgoin, Jacques Lannoo, Michel |
author_facet | Bourgoin, Jacques Lannoo, Michel |
author_sort | Bourgoin, Jacques |
collection | CERN |
id | cern-1624603 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1983 |
publisher | Springer |
record_format | invenio |
spelling | cern-16246032021-04-21T21:45:26Zdoi:10.1007/978-3-642-81832-5http://cds.cern.ch/record/1624603engBourgoin, JacquesLannoo, MichelPoint defects in semiconductorsChemical Physics and ChemistrySpringeroai:cds.cern.ch:16246031983 |
spellingShingle | Chemical Physics and Chemistry Bourgoin, Jacques Lannoo, Michel Point defects in semiconductors |
title | Point defects in semiconductors |
title_full | Point defects in semiconductors |
title_fullStr | Point defects in semiconductors |
title_full_unstemmed | Point defects in semiconductors |
title_short | Point defects in semiconductors |
title_sort | point defects in semiconductors |
topic | Chemical Physics and Chemistry |
url | https://dx.doi.org/10.1007/978-3-642-81832-5 http://cds.cern.ch/record/1624603 |
work_keys_str_mv | AT bourgoinjacques pointdefectsinsemiconductors AT lannoomichel pointdefectsinsemiconductors |