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Point defects in semiconductors

Detalles Bibliográficos
Autores principales: Bourgoin, Jacques, Lannoo, Michel
Lenguaje:eng
Publicado: Springer 1983
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-81832-5
http://cds.cern.ch/record/1624603
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author Bourgoin, Jacques
Lannoo, Michel
author_facet Bourgoin, Jacques
Lannoo, Michel
author_sort Bourgoin, Jacques
collection CERN
id cern-1624603
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1983
publisher Springer
record_format invenio
spelling cern-16246032021-04-21T21:45:26Zdoi:10.1007/978-3-642-81832-5http://cds.cern.ch/record/1624603engBourgoin, JacquesLannoo, MichelPoint defects in semiconductorsChemical Physics and ChemistrySpringeroai:cds.cern.ch:16246031983
spellingShingle Chemical Physics and Chemistry
Bourgoin, Jacques
Lannoo, Michel
Point defects in semiconductors
title Point defects in semiconductors
title_full Point defects in semiconductors
title_fullStr Point defects in semiconductors
title_full_unstemmed Point defects in semiconductors
title_short Point defects in semiconductors
title_sort point defects in semiconductors
topic Chemical Physics and Chemistry
url https://dx.doi.org/10.1007/978-3-642-81832-5
http://cds.cern.ch/record/1624603
work_keys_str_mv AT bourgoinjacques pointdefectsinsemiconductors
AT lannoomichel pointdefectsinsemiconductors