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Point defects in semiconductors

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Detalles Bibliográficos
Autores principales:	Bourgoin, Jacques, Lannoo, Michel
Lenguaje:	eng
Publicado:	Springer 1983
Materias:	Chemical Physics and Chemistry
Acceso en línea:	https://dx.doi.org/10.1007/978-3-642-81832-5 http://cds.cern.ch/record/1624603

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