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Analytical electron microscopy for materials science
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2002
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-4-431-66988-3 http://cds.cern.ch/record/1625095 |
| _version_ | 1780933615322923008 |
|---|---|
| author | Shindo, Daisuke Oikawa, Tetsuo |
| author_facet | Shindo, Daisuke Oikawa, Tetsuo |
| author_sort | Shindo, Daisuke |
| collection | CERN |
| id | cern-1625095 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2002 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-16250952021-04-21T21:42:41Zdoi:10.1007/978-4-431-66988-3http://cds.cern.ch/record/1625095engShindo, DaisukeOikawa, TetsuoAnalytical electron microscopy for materials scienceGeneral Theoretical PhysicsSpringeroai:cds.cern.ch:16250952002 |
| spellingShingle | General Theoretical Physics Shindo, Daisuke Oikawa, Tetsuo Analytical electron microscopy for materials science |
| title | Analytical electron microscopy for materials science |
| title_full | Analytical electron microscopy for materials science |
| title_fullStr | Analytical electron microscopy for materials science |
| title_full_unstemmed | Analytical electron microscopy for materials science |
| title_short | Analytical electron microscopy for materials science |
| title_sort | analytical electron microscopy for materials science |
| topic | General Theoretical Physics |
| url | https://dx.doi.org/10.1007/978-4-431-66988-3 http://cds.cern.ch/record/1625095 |
| work_keys_str_mv | AT shindodaisuke analyticalelectronmicroscopyformaterialsscience AT oikawatetsuo analyticalelectronmicroscopyformaterialsscience |