Theoretical concepts of X-ray nanoscale analysis: theory and applications

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in d...

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Detalles Bibliográficos
Autores principales: Benediktovitch, Andrei, Feranchuk, Ilya, Ulyanenkov, Alexander
Lenguaje:eng
Publicado: Springer 2013
Materias:
Particle Physics - Theory
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-38177-5
http://cds.cern.ch/record/1625586
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author Benediktovitch, Andrei
Feranchuk, Ilya
Ulyanenkov, Alexander
author_facet Benediktovitch, Andrei
Feranchuk, Ilya
Ulyanenkov, Alexander
author_sort Benediktovitch, Andrei
collection CERN
description This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data ana
id cern-1625586
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2013
publisher Springer
record_format invenio
spelling cern-16255862021-04-21T21:41:50Zdoi:10.1007/978-3-642-38177-5http://cds.cern.ch/record/1625586engBenediktovitch, AndreiFeranchuk, IlyaUlyanenkov, AlexanderTheoretical concepts of X-ray nanoscale analysis: theory and applicationsParticle Physics - TheoryThis book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data anaSpringeroai:cds.cern.ch:16255862013
spellingShingle Particle Physics - Theory
Benediktovitch, Andrei
Feranchuk, Ilya
Ulyanenkov, Alexander
Theoretical concepts of X-ray nanoscale analysis: theory and applications
title Theoretical concepts of X-ray nanoscale analysis: theory and applications
title_full Theoretical concepts of X-ray nanoscale analysis: theory and applications
title_fullStr Theoretical concepts of X-ray nanoscale analysis: theory and applications
title_full_unstemmed Theoretical concepts of X-ray nanoscale analysis: theory and applications
title_short Theoretical concepts of X-ray nanoscale analysis: theory and applications
title_sort theoretical concepts of x-ray nanoscale analysis: theory and applications
topic Particle Physics - Theory
url https://dx.doi.org/10.1007/978-3-642-38177-5
http://cds.cern.ch/record/1625586
work_keys_str_mv AT benediktovitchandrei theoreticalconceptsofxraynanoscaleanalysistheoryandapplications
AT feranchukilya theoreticalconceptsofxraynanoscaleanalysistheoryandapplications
AT ulyanenkovalexander theoreticalconceptsofxraynanoscaleanalysistheoryandapplications

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