UV/X-Ray Diffraction Radiation for non-intercepting Micron-Scale Beam Size Measurement

Diffraction radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarizes the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. Therefore DR can be used to develop non-invasive diagnostic tools. The aim of this project is to measure the transverse (vertical) beam size using incoherent DR. To achieve the micron-scale resolution required by CLIC, DR in UV and X-ray spectral-range must be investigated. During the next few years, experimental validation of such a scheme will be conducted on the CesrTA at Cornell University, USA. Here we present the current status of the experiment preparation.