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Electron beam testing technology
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
1993
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4899-1522-1 http://cds.cern.ch/record/1627988 |
| _version_ | 1780933942536306688 |
|---|---|
| author | Thong, John |
| author_facet | Thong, John |
| author_sort | Thong, John |
| collection | CERN |
| id | cern-1627988 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1993 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-16279882021-04-21T21:36:57Zdoi:10.1007/978-1-4899-1522-1http://cds.cern.ch/record/1627988engThong, JohnElectron beam testing technologyGeneral Theoretical PhysicsSpringeroai:cds.cern.ch:16279881993 |
| spellingShingle | General Theoretical Physics Thong, John Electron beam testing technology |
| title | Electron beam testing technology |
| title_full | Electron beam testing technology |
| title_fullStr | Electron beam testing technology |
| title_full_unstemmed | Electron beam testing technology |
| title_short | Electron beam testing technology |
| title_sort | electron beam testing technology |
| topic | General Theoretical Physics |
| url | https://dx.doi.org/10.1007/978-1-4899-1522-1 http://cds.cern.ch/record/1627988 |
| work_keys_str_mv | AT thongjohn electronbeamtestingtechnology |